The scanning electron microscope: A tool for the failure investigator.
Jiin-Woei Lee, Andrew Spowage and Nigel Brewitt 2010. The scanning electron microscope: A tool for the failure investigator.
Jiin-Woei Lee, Andrew Spowage and Nigel Brewitt 2010. The scanning electron microscope: A tool for the failure investigator.
| Title | The scanning electron microscope: A tool for the failure investigator. |
|---|---|
| Authors | Jiin-Woei Lee, Andrew Spowage and Nigel Brewitt |
| Year | 2010 |
| Output media | Institute of Materials, Malaysia (IMM) Newsletter |
| Publication dates | |
| Published | 2010 |
| Journal | Institute of Materials, Malaysia (IMM) Newsletter |