Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST

Omana, M., Rossi, D., Beniamino, E., Metra, C., Tirumurti, C. and Galivanche, R. 2016. Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST. IEEE Transactions on Computers. 65 (8), pp. 2484-2494. doi:10.1109/TC.2015.2490058

TitleLow-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST
AuthorsOmana, M., Rossi, D., Beniamino, E., Metra, C., Tirumurti, C. and Galivanche, R.
Abstract

During at-speed test of high performance sequential ICs using scan-based Logic BIST, the IC activity factor (AF) induced by the applied test vectors is significantly higher than that experienced during its in field operation. Consequently, power droop (PD) may take place during both shift and capture phases, which will slow down the circuit under test (CUT) signal transitions. At capture, this phenomenon is likely to be erroneously recognized as due to delay faults. As a result, a false test fail may be generated, with consequent increase in yield loss. In this paper, we propose two approaches to reduce the PD generated at capture during at-speed test of sequential circuits with scan-based Logic BIST using the Launch-On-Shift scheme. Both approaches increase the correlation between adjacent bits of the scan chains with respect to conventional scan-based LBIST. This way, the AF of the scan chains at capture is reduced. Consequently, the AF of the CUT at capture, thus the PD at capture, is also reduced compared to conventional scan-based LBIST. The former approach, hereinafter referred to as Low-Cost Approach (LCA), enables a 50% reduction in the worst case magnitude of PD during conventional logic BIST. It requires a small cost in terms of area overhead (of approximately 1.5% on average), and it does not increase the number of test vectors over the conventional scan-based LBIST to achieve the same Fault Coverage (FC). Moreover, compared to three recent alternative solutions, LCA features a comparable AF in the scan chains at capture, while requiring lower test time and area overhead. The second approach, hereinafter referred to as High-Reduction Approach (HRA), enables scalable PD reductions at capture of up to 87%, with limited additional costs in terms of area overhead and number of required test vectors for a given target FC, over our LCA approach. Particularly, compared to two of the three recent alternative solutions mentioned above, HRA enables a significantly lower AF in the scan chains during the application of test vectors, while requiring either a comparable area overhead or a significantly lower test time. Compared to the remaining alternative solutions mentioned above, HRA enables a similar AF in the scan chains at capture (approximately 90% lower than conventional scan-based LBIST), while requiring a significantly lower test time (approximately 4.87 times on average lower number of test vectors) and comparable area overhead (of approximately 1.9% on average).

KeywordsLogic BIST, Power Droop, Test, Microprocessor
JournalIEEE Transactions on Computers
Journal citation65 (8), pp. 2484-2494
ISSN0018-9340
Year2016
PublisherIEEE
Accepted author manuscriptTCOMP_2015.pdf
Digital Object Identifier (DOI)doi:10.1109/TC.2015.2490058
Publication dates
Published online12 Oct 2015
Published in printAug 2016
Published12 Oct 2015

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