Title | Low power probabilistic online monitoring of systematic erroneous behaviour |
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Authors | Gutierrez, M.D., Tenentes, V., Kazmierski, T.J. and Rossi, D. |
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Type | Conference paper |
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Abstract | Electronic devices with power-constrained embedded systems are used for a variety of IoT applications, such as geo-monitoring, parking sensors and surveillance, which may tolerate few errors and may not be constrained by a strict error detection latency requirement. In this poster, we propose a novel low power online error monitoring technique that produces an alarm signal when systematic erroneous behaviour has occurred over a pre-defined time interval. A monitoring architecture monitors the signal probabilities of the logic cones concurrently to its normal operation and compares them on-chip against the signature of error-free behaviour. Results on a set of the EPFL'15 benchmarks show an average error coverage of 82.9%% of errors induced by stuck-at faults, with an average area cost of 1.2% and an error detection latency of [0.01, 3.3] milliseconds. |
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Keywords | Circuit faults, Monitoring, Systematics, Radiation detectors, Benchmark testing, Logic gates |
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Year | 2017 |
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Conference | 2017 22nd IEEE Test Symposium (ETS) |
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Publisher | IEEE |
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Accepted author manuscript | |
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Publication dates |
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Published | 07 Jul 2017 |
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ISSN | 1530-1877 |
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ISBN | 9781509054572 |
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Digital Object Identifier (DOI) | https://doi.org/10.1109/ETS.2017.7968239 |
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